Senior IC Physical Failure Analysis Engineer

NVIDIA Networking IC Product Engineering team is looking for a highly skilled IC physical failure analysis (PFA) engineer to join our growing team and support PFA activities for yield improvement, product bring-up, customer returns, and product qualification. As a PFA engineer, you will own the physical failure analysis (PFA) part, develop work procedures/techniques/recipes, and perform PFA of IC’s using in-house equipment and in external labs.

What You Will Be Doing:

Opera

• te dual-beam PFIB and develop workflows for the following applications:

• Site-specific cross-sectioning

• TEM sample preparation

• IC delayer

• Large scale cross-sections

• Unique sample preparation for different probing and imaging techniques

Use

• SEM based nanoprobing techniques for fault isolation and device/cell characterization based on FA plan provided by the EFA engineers

• EBAC/EBIC/EBRICH for fault isolation

• Device and cell level measurements

• Own and lead nanoprobing activities, including method development and execution.  Continuously drive improvements, stay up-to date, and collaborate with vendors on new techniques.

• Sample preparation for optical fault isolation, probing and more: use P-lapping and CNC for Si thinning and IC delayering

What We Need to See:

• BSc in Materials/chemical engineering, physics, chemistry, or related fields

• 5+ years of relevant industry experience in IC package or die level Failure Analysis.

• Ability to work and collaborate as part of a team and independently

• Self-motivated with the ability to learn alone and review the literature to find solutions to our challenges.

• Insist on high standards for high-quality samples

• Good documentation and communication skills

Ways To Stand Out From The Crowd:

• Good understanding of VLSI circuit design, and/or device physics, and/or IC process engineering

• Experience with various IC delayering methods

• Background with dual beam FIB for cross-sections and preparing lamella for TEM

• Experience with SEM based nano-probing